1. The study of topological properties and phase transitions in topological crystalline insulators (TCIs) has attracted a lot of attention in condensed matter physics.
2. SnTe is the first TCI material to be theoretically predicted and experimentally realized, and its topological surface states (TSSs) are protected by lattice symmetries instead of time-reverse symmetry.
3. This article demonstrates carrier density tunable transport in SnTe thin films, with a giant linear magnetoresistance (GLMR) up to 1849% under 14 T at 2 K, as well as weak antilocalization (WAL) and high-field LMR with a much smaller magnitude than the GLMR in the as grown sample.
This article provides an overview of the research conducted on topological crystalline insulator SnTe thin films, focusing on their carrier density tunable transport properties. The authors present evidence for their claims through reflection high-energy electron diffraction (RHEED), X-ray diffraction (XRD), temperature-dependent sheet resistance Rs, and magneto-transport results. The article is well written and easy to understand, providing clear explanations for each step of the research process.
The authors provide sufficient evidence to support their claims regarding the structural characterization of SnTe thin films, temperature-dependent sheet resistance Rs, and magneto-transport results. However, there are some potential biases that should be noted when evaluating this article's trustworthiness and reliability. For example, the authors do not explore any counterarguments or alternative explanations for their findings; they only present one side of the argument without considering other possible interpretations or implications of their results. Additionally, there is no discussion about possible risks associated with this type of research or any potential negative consequences that could arise from manipulating carrier density in SnTe thin films.
In conclusion, this article provides an informative overview of research conducted on topological crystalline insulator SnTe thin films and presents evidence to support its claims regarding carrier density tunable transport properties; however, it does not explore any counterarguments or alternative explanations for its findings nor does it discuss any potential risks associated with this type of research.