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Efficient immersion imaging of components with nonplanar surfaces | IEEE Journals & Magazine | IEEE Xplore
Source: ieeexplore.ieee.org
Article summary:
1. This paper presents an efficient way to compute the appropriate element time delays in immersion without compromising the measurement accuracy.
2. An analytical model is developed to determine a relationship between estimated propagation time errors and their effect on the array inspection in terms of signal amplitude from a reflector.
3. The imaging speed depends on the complexity of the surface and the total number of image pixels, and this is a key concern for industrial end-users.
Article analysis:
The article provides an efficient way to compute element time delays in immersion without compromising measurement accuracy, which is beneficial for industrial end-users who are concerned with imaging speed. The analytical model presented in the article helps to determine a relationship between estimated propagation time errors and their effect on array inspection performance, which can be used to optimize parameters for time delay calculation.
The article appears to be reliable and trustworthy as it provides detailed information about how to calculate element time delays in immersion, as well as an analytical model that can be used to optimize parameters for time delay calculation. Furthermore, it does not appear to contain any promotional content or partiality towards any particular point of view or product/service. Additionally, possible risks associated with using this method are noted throughout the article, such as reduced signal amplitude from a reflector due to estimated propagation time errors.
The only potential issue with this article is that it does not present both sides equally; instead, it focuses solely on presenting one side (i.e., how to calculate element time delays in immersion). However, this is understandable given that the purpose of the article is not to explore counterarguments but rather provide information about how to efficiently calculate element time delays in immersion without compromising measurement accuracy.