1. This article examines the effects of chemical reactions on β-Ga2O3 (100) substrates during chemical mechanical polishing.
2. The results showed that H3PO4 was more effective than NaOH in improving the polishing efficiency and quality of Ga2O3.
3. XPS analysis indicated that Ga2O3 produced Ga3+ in the H3PO4 solution, which may have contributed to the improved polishing results.
This article is generally reliable and trustworthy, as it provides a detailed overview of the research conducted and its findings. The authors provide evidence for their claims, such as XPS analysis to support their conclusions about the effects of H3PO4 and NaOH on Ga2O3 during CMP. Furthermore, they acknowledge potential limitations of their study, such as not being able to determine whether other factors may have contributed to the improved polishing results.
The article does not appear to be biased or one-sided in its reporting; it presents both sides equally by discussing both acid and alkaline conditions for CMP and providing evidence for each condition's effectiveness. Additionally, all claims are supported with evidence from experiments or other sources, so there are no unsupported claims present in this article.
The only potential issue with this article is that it does not explore any counterarguments or alternative explanations for its findings; however, this is understandable given that this is a research paper rather than an opinion piece or debate article. There is also no promotional content present in this article; instead, it focuses solely on presenting research findings without attempting to promote any particular product or service.