1. Transient electroluminescence measurements were used to analyze the contribution of electrons and holes on the transport and efficiency of both pristine and degraded PHOLEDs.
2. For pristine PHOLEDs, the transport is electron dominated.
3. Degradation of the PHOLEDs upon electrical aging is not related to the hole transport but is governed by a decrease in the electron transport due to the formation of electron traps.
The article “Transient electroluminescence on pristine and degraded phosphorescent blue OLEDs” from Journal of Applied Physics provides an analysis of how electrons and holes contribute to the transport and efficiency of both pristine and degraded PHOLEDs. The article appears to be well-researched, with evidence provided for its claims, such as data from transient electroluminescence measurements. However, there are some potential biases that should be noted. For example, while it does provide evidence for its claims, it does not explore any counterarguments or present any alternative theories or explanations for its findings. Additionally, it does not discuss any possible risks associated with using PHOLEDs or provide any recommendations for mitigating these risks. Furthermore, while it does provide evidence for its claims, it does not discuss any potential limitations or caveats associated with its findings or methods used in obtaining them. In conclusion, while this article appears to be reliable overall, there are some potential biases that should be taken into consideration when evaluating its trustworthiness and reliability.