1. High-voltage SiC MOSFETs can generate electromagnetic interference (EMI) due to their fast switching speeds and high dv/dt and di/dt.
2. The multi-level turn-off (MLTO) active gate driver is proposed as a solution to address the EMI issues by actively balancing the switching speed and power losses.
3. This paper provides a comparison between the MLTO and the conventional turn-off (CTO) drivers, analyzing the switching model of SiC MOSFET under MLTO and CTO, as well as performing double pulse tests (DPTs).
The article is generally reliable in its presentation of information regarding the comparison between the multi-level turn-off (MLTO) active gate driver and the conventional turn-off (CTO) drivers for controlling high voltage SiC MOSFETs. The article provides a thorough analysis of both methods, including theoretical models for each method, experimental results from double pulse tests (DPTs), and design requirements for optimizing each method.
The article does not appear to be biased or one-sided in its reporting, as it presents both methods fairly and objectively. It also does not appear to contain any unsupported claims or missing points of consideration; all claims are supported with evidence from theoretical models or experimental results. Additionally, there are no unexplored counterarguments or promotional content present in the article.
The only potential issue with this article is that it does not discuss possible risks associated with either method; however, this is likely due to space constraints rather than an intentional omission on behalf of the authors. In general, though, this article appears to be trustworthy and reliable in its presentation of information regarding MLTO and CTO drivers for controlling high voltage SiC MOSFETs.