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Article summary:
1. PbPdO2 thin films with (002) preferred orientation were prepared by pulsed laser deposition (PLD), and a positive CER effect was observed in the PbPdO2 films.
2. The temperature dependences of resistance and resistivity, R (T) and ρI (T), were measured under different applied DC currents, and a critical temperature Tc with about T = 260 K for all applied currents was found.
3. An internal electric field model and its induced potential barrier were established, which well explains the positive CER effect and the critical temperature Tc.
Article analysis:
The article is overall reliable and trustworthy as it provides detailed information on the experimental methods used to measure the temperature dependences of resistance and resistivity, R (T) and ρI (T). It also presents an internal electric field model that explains the positive CER effect observed in PbPdO2 thin films. The article is supported by evidence from energy dispersive spectrometer (EDS), electron paramagnetic resonance (EPR) and in-situ x-ray photoelectron spectroscopy (XPS). Furthermore, first-principles calculation is used to support the findings of this study.
However, there are some points that could be improved upon in terms of trustworthiness and reliability. For example, there is no mention of possible risks associated with using pulsed laser deposition or any other methods used in this study. Additionally, there is no discussion of counterarguments or alternative explanations for the results presented in this article. Finally, while the authors provide evidence to support their claims, they do not explore any unexplored counterarguments or present both sides equally when discussing their findings.