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Article summary:
1. Functionalization of AFM tips with Xe adatoms can be used to investigate molecules adsorbed on graphene surfaces.
2. Non-contact atomic force microscopy (ncAFM) was used to investigate the adsorption of Xe on graphene on Pt(111) surfaces at 5 K.
3. Force spectroscopy can be used to distinguish Xe islands from bare graphene areas without the need of atomic resolution.
Article analysis:
The article is generally reliable and trustworthy, as it provides a detailed description of the research conducted and its results. The authors provide evidence for their claims, such as the use of non-contact atomic force microscopy (ncAFM) to investigate the adsorption of Xe on graphene on Pt(111) surfaces at 5 K, and the use of force spectroscopy to distinguish Xe islands from bare graphene areas without the need of atomic resolution. The article does not appear to have any biases or one-sided reporting, as it presents both sides equally and does not promote any particular point of view. Furthermore, there are no unsupported claims or missing points of consideration in the article.
The only potential issue with this article is that it does not explore any counterarguments or possible risks associated with using functionalized AFM tips for investigating molecules adsorbed on graphene surfaces. This could be addressed by providing more information about potential risks associated with this technique, as well as exploring alternative methods that could be used instead.