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Article summary:

1. This article describes a simple and compact far-infrared Fourier transform spectrometer that works as a Michelson interferometer without a beam splitter.

2. The interferometer is intended for operation at frequencies between 0.1 and 3 THz with a frequency resolution of 6 GHz, and is used to characterize both continuous-wave and pulsed terahertz emitters, as well as different terahertz detectors.

3. The design has several advantages compared with other types of far-IR interferometers, such as being nondispersive, polarization-insensitive, and not subject to vibrational noise.

Article analysis:

The article is written in an objective manner and provides detailed information about the design of the interferometer and its advantages over other types of far-IR interferometers. The authors provide evidence for their claims by citing relevant research papers in the field, which adds to the trustworthiness of the article. Furthermore, the authors discuss potential risks associated with using this type of instrumentation, such as alignment issues that can affect accuracy of measurements.

However, there are some points that could be further explored in order to make the article more comprehensive. For example, it would be beneficial to include more information about how this type of instrumentation can be used in practical applications or what kind of data can be obtained from it. Additionally, while the authors do mention potential risks associated with using this type of instrumentation, they do not provide any suggestions on how these risks can be mitigated or avoided altogether.

In conclusion, overall this article is reliable and trustworthy due to its objective tone and evidence provided for its claims; however there are some areas where it could be improved upon by providing more information about practical applications or ways to mitigate potential risks associated with using this type of instrumentation.