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Article summary:
1. Scanning Thermal Gate Microscopy (STGM) is a novel non-destructive method to probe the local thermoelectric properties of devices made of 2D and thin film materials with few tens of nm lateral resolution.
2. STGM was applied to multiple graphene devices, imaging local thermoelectric phenomena at varying carrier concentrations.
3. The technique presented in this work does not require the use of multiple lock-in amplifiers, which substantially increases the achievable scanning speed and makes the method readily applicable for any SThM setup.
Article analysis:
The article provides an overview of a new technique for measuring local thermoelectric properties in 2D material nanostructures using scanning thermal gate microscopy (STGM). The authors provide evidence for their claims by citing previous studies and experiments that have been conducted on similar topics, as well as providing examples from their own experiments.
The article is generally reliable and trustworthy, however there are some potential biases that should be noted. For example, the authors focus mainly on graphene devices when discussing their results, which could lead to a bias towards this particular material over other materials that could potentially be used in similar applications. Additionally, while the authors do cite previous studies related to their topic, they do not explore any counterarguments or alternative perspectives that may exist within these studies or elsewhere in the literature.
In terms of missing points of consideration, it would have been beneficial if the authors had discussed potential risks associated with using STGM such as radiation exposure or damage to delicate samples due to excessive heat generated by the tip during measurements. Furthermore, while the authors discuss how STGM can be used to measure local thermoelectric properties in 2D materials, they do not provide any information about how this technique could be applied to other types of materials or structures such as 3D nanostructures or bulk materials.
Finally, it should also be noted that there is no promotional content present in this article and both sides of an argument are presented equally throughout its entirety.
Topics for further research:
Radiation exposure from scanning thermal gate microscopy
Damage to delicate samples from scanning thermal gate microscopy
Application of scanning thermal gate microscopy to 3D nanostructures
Application of scanning thermal gate microscopy to bulk materials
Alternative perspectives on local thermoelectric properties in 2D materials
Potential risks associated with measuring local thermoelectric properties in 2D materials