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Article summary:
1. A method is proposed for aligning the pivot point of a precessing electron probe in the scanning transmission electron microscope (STEM).
2. The power spectra of virtual bright-field images extracted from SPED data are used to measure the precession-induced blur as a function of precession angle.
3. Physical limits governing the minimal size of a precessing electron probe are expounded.
Article analysis:
The article is generally reliable and trustworthy, as it provides an overview of a method for aligning the pivot point of a precessing electron probe in the scanning transmission electron microscope (STEM), and for assessing the spatial resolution in scanning precession electron diffraction (SPED) experiments. The article also presents physical limits governing the minimal size of a precessing electron probe, which is useful information for researchers working with this technology.
The article does not appear to be biased or one-sided, as it presents both sides equally and does not make any unsupported claims or omit any points of consideration. It also does not contain any promotional content or partiality, and possible risks are noted throughout the text.
In conclusion, this article appears to be reliable and trustworthy, providing useful information about aligning and assessing spatial resolution in SPED experiments without any bias or one-sidedness.